X-Ray Fluorescence Spectroscopy

 | Post date: 2021/09/9 | 
X-ray fluorescence (XRF), which has been applied during the 1970s to 1990s, is based on the observation of (X-ray) photon emissions of atoms, which are induced into an excited state by irradiation with X-rays causing the removal of a core electron from the atom. The resulting inner shell vacancies are filled by electrons from outer shells of the same atom. The difference in energy between the two electron orbitals appears as an emitted X-ray photon, which can be measured with an X-ray spectrometer.
The technology used for the separation (dispersion), identification and intensity measurement of a sample's X-ray fluorescence spectrum gives rise to two main types of spectrometer: wavelength dispersive (WDXRF) and energy dispersive (EDXRF) systems.
In WDXRF spectrometers, the X-ray tube acting as a source irradiates a sample directly, and the fluorescence coming from the sample is measured with a wavelength dispersive detection system. The characteristic radiation coming from each individual element can be identified using analyzing crystals which separate the X-rays based on their wavelength, or conversely their energies.
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